Please use this identifier to cite or link to this item: http://hdl.handle.net/2307/216
Title: M3M45M45 Auger lineshape measured from the Cu(111) surface: Multiplet term selectivity in angle-resolved Auger-photoelectron coincidence spectroscopy
Authors: Gotter, R.
Da Pieve, F.
Offi, Francesco
Ruocco, Alessandro
Verdini, A.
Yao, H.
Bartynski, R.
Stefani, Giovanni
Keywords: 2-STEP DOUBLE PHOTOIONIZATION
X-RAY
FINE-STRUCTURE
ELECTRON DIFFRACTION
CIRCULAR-DICHROISM
LINE-SHAPES
AUGER
CU(111)
PHOTOEMISSION
COPPER
Issue Date: Feb-2009
Publisher: American Physical Society
Abstract: The capability of the recently observed dichroic effect inangle-resolved Auger-photoelectron coincidence spectroscopy (DEAR-APECS) to disentangle individual multiplet terms has been exploited to study the lineshape of the M3M45M45 Auger spectrum measured in coincidence with the 3p(3/2) photoelectrons from theCu(111) surface. The relevant multiplet structure of the two hole final state is determined with an unprecedented sensitivity, including are liable experimental estimation of the energy of the D-1 multipletterm. Spectroscopic data for the 3p photoemission feature are also given and energy conservation applied to the photoelectron-Auger-electron pair has been successfully used in orderto quantitatively explain energy shifts in coincidence spectra. Multiple-scattering calculations prove that the DEAR-APECS effect is not destroyed by diffraction effects and a simple model which combines atomic angular distributions and electron-diffraction modulations is provided in order to obtain a detailed understanding of the multiplet energy and intensity distributions in Auger spectra.
URI: http://hdl.handle.net/2307/216
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.79.075108
Appears in Collections:A - Articolo su rivista
X_Dipartimento di Fisica 'Edoardo Amaldi'

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