Please use this identifier to cite or link to this item: http://hdl.handle.net/2307/216
DC FieldValueLanguage
dc.contributor.authorGotter, R.-
dc.contributor.authorDa Pieve, F.-
dc.contributor.authorOffi, Francesco-
dc.contributor.authorRuocco, Alessandro-
dc.contributor.authorVerdini, A.-
dc.contributor.authorYao, H.-
dc.contributor.authorBartynski, R.-
dc.contributor.authorStefani, Giovanni-
dc.date.accessioned2010-05-27T15:17:36Z-
dc.date.available2010-05-27T15:17:36Z-
dc.date.issued2009-02-
dc.identifier.issn1098-0121-
dc.identifier.urihttp://hdl.handle.net/2307/216-
dc.description.abstractThe capability of the recently observed dichroic effect inangle-resolved Auger-photoelectron coincidence spectroscopy (DEAR-APECS) to disentangle individual multiplet terms has been exploited to study the lineshape of the M3M45M45 Auger spectrum measured in coincidence with the 3p(3/2) photoelectrons from theCu(111) surface. The relevant multiplet structure of the two hole final state is determined with an unprecedented sensitivity, including are liable experimental estimation of the energy of the D-1 multipletterm. Spectroscopic data for the 3p photoemission feature are also given and energy conservation applied to the photoelectron-Auger-electron pair has been successfully used in orderto quantitatively explain energy shifts in coincidence spectra. Multiple-scattering calculations prove that the DEAR-APECS effect is not destroyed by diffraction effects and a simple model which combines atomic angular distributions and electron-diffraction modulations is provided in order to obtain a detailed understanding of the multiplet energy and intensity distributions in Auger spectra.en
dc.language.isoenen
dc.publisherAmerican Physical Societyen
dc.relation.ispartofPhysical Review Ben
dc.rightsThe American Physical Societyen
dc.subject2-STEP DOUBLE PHOTOIONIZATIONen
dc.subjectX-RAYen
dc.subjectFINE-STRUCTUREen
dc.subjectELECTRON DIFFRACTIONen
dc.subjectCIRCULAR-DICHROISMen
dc.subjectLINE-SHAPESen
dc.subjectAUGERen
dc.subjectCU(111)en
dc.subjectPHOTOEMISSIONen
dc.subjectCOPPERen
dc.titleM3M45M45 Auger lineshape measured from the Cu(111) surface: Multiplet term selectivity in angle-resolved Auger-photoelectron coincidence spectroscopyen
dc.typeArticleen
dc.subject.miurSettori Disciplinari MIUR::Scienze fisiche::FISICA DELLA MATERIAen
dc.subject.isicruiCategorie ISI-CRUI::Scienze fisiche::Applied Physics/Condensed Matter/Materials Scienceen
dc.subject.anagraferoma3Scienze fisicheen
dc.relation.volumenumber79en
dc.relation.pagenumber075108en
dc.identifier.doi10.1103/PhysRevB.79.075108-
dc.relation.issuenumber7en
item.languageiso639-1other-
item.fulltextWith Fulltext-
item.grantfulltextrestricted-
Appears in Collections:A - Articolo su rivista
X_Dipartimento di Fisica 'Edoardo Amaldi'
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