Please use this identifier to cite or link to this item:
http://hdl.handle.net/2307/216
DC Field | Value | Language |
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dc.contributor.author | Gotter, R. | - |
dc.contributor.author | Da Pieve, F. | - |
dc.contributor.author | Offi, Francesco | - |
dc.contributor.author | Ruocco, Alessandro | - |
dc.contributor.author | Verdini, A. | - |
dc.contributor.author | Yao, H. | - |
dc.contributor.author | Bartynski, R. | - |
dc.contributor.author | Stefani, Giovanni | - |
dc.date.accessioned | 2010-05-27T15:17:36Z | - |
dc.date.available | 2010-05-27T15:17:36Z | - |
dc.date.issued | 2009-02 | - |
dc.identifier.issn | 1098-0121 | - |
dc.identifier.uri | http://hdl.handle.net/2307/216 | - |
dc.description.abstract | The capability of the recently observed dichroic effect inangle-resolved Auger-photoelectron coincidence spectroscopy (DEAR-APECS) to disentangle individual multiplet terms has been exploited to study the lineshape of the M3M45M45 Auger spectrum measured in coincidence with the 3p(3/2) photoelectrons from theCu(111) surface. The relevant multiplet structure of the two hole final state is determined with an unprecedented sensitivity, including are liable experimental estimation of the energy of the D-1 multipletterm. Spectroscopic data for the 3p photoemission feature are also given and energy conservation applied to the photoelectron-Auger-electron pair has been successfully used in orderto quantitatively explain energy shifts in coincidence spectra. Multiple-scattering calculations prove that the DEAR-APECS effect is not destroyed by diffraction effects and a simple model which combines atomic angular distributions and electron-diffraction modulations is provided in order to obtain a detailed understanding of the multiplet energy and intensity distributions in Auger spectra. | en |
dc.language.iso | en | en |
dc.publisher | American Physical Society | en |
dc.relation.ispartof | Physical Review B | en |
dc.rights | The American Physical Society | en |
dc.subject | 2-STEP DOUBLE PHOTOIONIZATION | en |
dc.subject | X-RAY | en |
dc.subject | FINE-STRUCTURE | en |
dc.subject | ELECTRON DIFFRACTION | en |
dc.subject | CIRCULAR-DICHROISM | en |
dc.subject | LINE-SHAPES | en |
dc.subject | AUGER | en |
dc.subject | CU(111) | en |
dc.subject | PHOTOEMISSION | en |
dc.subject | COPPER | en |
dc.title | M3M45M45 Auger lineshape measured from the Cu(111) surface: Multiplet term selectivity in angle-resolved Auger-photoelectron coincidence spectroscopy | en |
dc.type | Article | en |
dc.subject.miur | Settori Disciplinari MIUR::Scienze fisiche::FISICA DELLA MATERIA | en |
dc.subject.miur | Scienze fisiche | - |
dc.subject.isicrui | Categorie ISI-CRUI::Scienze fisiche::Applied Physics/Condensed Matter/Materials Science | en |
dc.subject.isicrui | Scienze fisiche | - |
dc.subject.anagraferoma3 | Scienze fisiche | en |
dc.relation.volumenumber | 79 | en |
dc.relation.pagenumber | 075108 | en |
dc.identifier.doi | 10.1103/PhysRevB.79.075108 | - |
dc.relation.issuenumber | 7 | en |
dc.description.romatrecurrent | Dipartimento di Fisica 'Edoardo Amaldi' | * |
item.grantfulltext | restricted | - |
item.languageiso639-1 | other | - |
item.fulltext | With Fulltext | - |
Appears in Collections: | A - Articolo su rivista X_Dipartimento di Fisica 'Edoardo Amaldi' |
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